IADR Abstract Archives

Artefacts caused by dental materials in MRI and CT

Objectives: The specifications of dental materials for oral applications are well defined and accepted. Less known is their influence on imaging with computed tomography (CT) and magnetic resonance imaging (MRI). The diagnostics of CT or MRI images is complicated by ingredients of filling or restoration materials which cause superposition, erasements and distortions. The aim of this in-vitro research was to characterise artefacts of different restoration materials in CT and MRI.

Methods: Test specimens of metal and non-metal restoration materials were fabricated and embedded with a reference specimen. The samples were placed in a 1.5-teslar MRI and CT (both Siemens, Germany) and evaluated in two dimensions. Artefact size and distortions were measured by using digital image analisis software.

Results: Out of 35 filling materials 6 materials showed no artefacts in CT. All metal based materials and 9 filling materials showed inhomogeneities in MRI. Artefacts which were caused by materials containing titanium and zirconia as well as filling materials consisting of rare earths showed erasements.

Conclusions: Metal based restoration materials had strong influence on CT, but they did not cause any artefacts in MRI images. Rare earths, such as Ytterbiumtrifluorid, as component of dental materials led to effacements in the MRI, but not in the CT. Developments of new dental materials should recognise these findings to reduce artefacts in MRI and CT images.


Division: Pan European Federation Meeting
Meeting: 2008 Pan European Federation Meeting (London, England)
Location: London, England
Year: 2008
Final Presentation ID: 192
Abstract Category|Abstract Category(s): PEF IADR 2008
Authors
  • Klinke, Thomas  ( University of Greifswald, Greifswald, N/A, Germany )
  • Wetzel, Juliane  ( University of Greifswald, Greifswald, N/A, Germany )
  • Biffar, Reiner  ( University of Greifswald, Greifswald, N/A, Germany )
  • SESSION INFORMATION
    Poster Session
    Materials Properties
    09/10/2008