IADR Abstract Archives

Bond Strength to Ground and Un-ground Enamel of G-aenial Bond

Objective: There is a concern about bond strength with 7th-generation bonding agents on un-cut enamel. Bond strengths of 7th-generation bonding agents (G-aenial Bond, GB; Bond Force, BF; Xeno IV, X; Optibond All-In-One, O) with composite (TPH3) on un-ground and ground human enamel and dentin with and without thermal cycling were measured. Methods: Specimens of freshly extracted human teeth were prepared as un-ground (UGE) and ground (GE) enamel and ground dentin (D) through 600-grit silicon carbide paper. GB on UGE, GE and D specimens were prepared both with and without acid etch (37% phosphoric acid). BF, X, and O were not used with phosphoric acid. Bond strengths (Ultradent shear bond test) were determined on a testing machine (Instron) at 1 mm/min after 24 h storage in water at 37°C and after thermo-cycling of 5000 cycles (TC) in water between 5 and 55°C. Results: Means and standard deviations for 24 h data are shown in the table. Data were analyzed with ANOVA at the 0.05 level of significance. Means with the same letter are statistically the same.

Bonding Agent

Substrate

Condition

Bond Strength, MPa

GB

UGE

Un-etched

19.9(4.8)

GB

UGE

etched

25.0(4.9)

O

UGE

Un-etched

17.9(7.0)

X

UGE

Un-etched

14.1(8.2)

BF

UGE

Un-etched

9.6(3.3)

GB

GE

Un-etched

29.3(2.8)a

GB

GE

etched

27.9(4.0)a

O

GE

Un-etched

25.7(2.9)b

X

GE

Un-etched

20.6(2.8)

BF

GE

Un-etched

24.7(1.0)b

GB

D

Un-etched

31.4(3.6)c

GB

D

etched

29.2(6.1)

O

D

Un-etched

32.9(5.1)c

X

D

Un-etched

26.4(5.1)

BF

D

Un-etched

17.8(1.6)

 

Conclusions: Bond strength of GB to etched UGE after 24 h was statistically higher than O, X and BF. Bond strength of GB to etched UGE is statistically higher than to un-etched UGE after 24 h. Bond strengths of GB on un-etched UGE, GE and D were statistically higher than those of X and BF for 24 h and TC. Supported by GC America.


Division: IADR/AADR/CADR General Session
Meeting: 2011 IADR/AADR/CADR General Session (San Diego, California)
Location: San Diego, California
Year: 2011
Final Presentation ID: 3167
Abstract Category|Abstract Category(s): Dental Materials 1: Adhesion - Bond Strength Testing and Mechanisms
Authors
  • Hirano, Kyosuke  ( GC America, Inc, Alsip, IL, USA )
  • Yapp, Ron Arthur  ( Dental Consultants, Inc, Ann Arbor, MI, USA )
  • Powers, John M.  ( Dental Consultants, Inc, Ann Arbor, MI, USA )
  • Heiss, Mark A.  ( GC America, Inc, Alsip, IL, USA )
  • SESSION INFORMATION
    Poster Session
    Adhesion to Dental Tissues V
    03/19/2011