IADR Abstract Archives

Microtensile Dentin Adhesive Bond Strength After ESEM Vacuum Exposure

The dentin/adhesive interface was studied under wet conditions using the Environmental Scanning Electron Microscope (ESEM) to determine if the vacuum weakened the adhesive interface during observation.  Objectives: To compare the microtensile bond strength of an ethanol based, two-step total etch adhesive system PQ1 UltradentTM bonded to dentin with and without exposure to an ESEM vacuum.  Methods: After IRB approval, two 3rd molar teeth extracted from each of four patients received a rectangular class I occlusal preparation 5.0 x 7.0 x 2.0 mm.  Each preparation was restored with the adhesive and 3MTMESPETMFlitekTMZ250 Universal Restorative following manufacturer's directions.  After 24 hours of storage in water at 25oC, each tooth was sectioned to obtain two slices 0.75 mm wide.  One slice was etched for 5.0 sec with 35% phosphoric acid to remove the smear layer and exposed to ESEM vacuum at 5.4-6.0 torr for 30 minutes at 10.0 kV up to 1000x under wet conditions and the other slice remained untreated.  Each slice was further sectioned to obtain 4-5 rectangular specimens with a surface area of 0.5 mm2. Samples were tested on an EnduraTEC ELF 3300 at a crosshead speed of 1.0 mm/min till failure. A previous pilot study determined that 21 samples/group were necessary to detect a statistically significant difference of 25% between means at p ≤ 0.05 and β = 0.20.

Results:

Adhesive

N

Mean (StD) in MPa

PQ1

22

41.7 (15.1)

PQ1 vacuum

22

39.9 (10.7)

There was no statistically significant difference between means (t-test (p≤0.05)). Conclusion: Exposure of the dentin adhesive interface under vacuum and wet conditions on the ESEM had no effect on the microtensile bond strength of the dentin adhesive interface.  Supported in part by USPHS Grant K23-DE016324.   purkj@umkc.edu


AADR/CADR Annual Meeting
2006 AADR/CADR Annual Meeting (Orlando, Florida)
Orlando, Florida
2006
280
Dental Materials: I - Adhesion-Composite Bond Strength
  • Purk, John  ( University of Missouri -Kansas City, Kansas City, MO, USA )
  • Timock, Adam  ( University of Missouri -Kansas City, Kansas City, MO, USA )
  • Redfearn, Trent  ( University of Missouri -Kansas City, Kansas City, MO, USA )
  • Dusevich, Vladimir  ( University of Missouri -Kansas City, Kansas City, MO, USA )
  • Eick, J. David  ( University of Missouri -Kansas City, Kansas City, MO, USA )
  • Poster Session
    General Adhesion
    03/09/2006